NANOTECHNOLOGY, vol. 25, no. 49, page. 495204, 2014-12-12
SOLID-STATE ELECTRONICS, vol. 102, page. 42 - 45, 2014-12
IEEE ELECTRON DEVICE LETTERS, vol. 35, no. 10, page. 1022 - 1024, 2014-10
Semiconductor Science and Technology, vol. 29, no. 10, page. 104006 - 104010, 2014-10
JOURNAL OF ELECTRONIC MATERIALS, vol. 43, no. 9, page. 3635 - 3639, 2014-09
NANOSCALE RESEARCH LETTERS, vol. 9, page. 364, 2014-07-25
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, vol. 32, no. 4, 2014-07
IEEE ELECTRON DEVICE LETTERS, vol. 35, no. 6, page. 636 - 638, 2014-06
JAPANESE JOURNAL OF APPLIED PHYSICS, vol. 53, no. 6, 2014-06
IEEE Transactions on Industrial Electronics, vol. 61, no. 6, page. 2933 - 2941, 2014-06
Applied Physics Letters, vol. 104, no. 8, page. 83507, 2014-02-24
APPLIED PHYSICS LETTERS, vol. 104, no. 5, 2014-02-03
IEEE ELECTRON DEVICE LETTERS, vol. 35, no. 2, page. 214 - 216, 2014-02
IEEE Electron Device Letters, vol. 35, no. 1, page. 60 - 62, 2014-01
ECS SOLID STATE LETTERS, vol. 3, no. 10, page. P117 - P119, 2014-01
ECS SOLID STATE LETTERS, vol. 3, no. 10, page. P120 - P122, 2014-01
ECS SOLID STATE LETTERS, vol. 3, no. 11, page. P136 - P139, 2014-01