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Cited 13 time in webofscience Cited 16 time in scopus
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Engineering Oxygen Vacancy of Tunnel Barrier and Switching Layer for Both Selectivity and Reliability of Selector-Less ReRAM

Title
Engineering Oxygen Vacancy of Tunnel Barrier and Switching Layer for Both Selectivity and Reliability of Selector-Less ReRAM
Authors
Lee, SLee, DWoo, JCha, EPark, JHwang, H
POSTECH Authors
Hwang, H
Date Issued
Oct-2014
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
URI
http://oasis.postech.ac.kr/handle/2014.oak/13570
DOI
10.1109/LED.2014.2347925
ISSN
0741-3106
Article Type
Article
Citation
IEEE ELECTRON DEVICE LETTERS, vol. 35, no. 10, page. 1022 - 1024, 2014-10
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황현상HWANG, HYUNSANG
Dept of Materials Science & Enginrg
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