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LEE, JEONG SOO(이정수) researcherid scopus

Department: Dept of Electrical Engineering(전자전기공학과)

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Publication & Time Cited Count (For the Last 5 years)

Results 1-20 of 72 (Search time: 0.002 seconds).

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Date Issued : [2010 TO 2019]

Article

Caution: Abnormal Variability Due to Terrestrial Cosmic Rays in Scaled-Down FinFETsSCIESCOPUS

IEEE TRANSACTIONS ON ELECTRON DEVICES, vol. 66, no. 4, page. 1887 - 1891, 2019-04

Article

Soft Error in Saddle Fin Based DRAMSCIESCOPUS

IEEE Electron Device Letters, vol. 40, no. 4, page. 494 - 497, 2019-04

Article

Single-Event Transient in FinFETs and Nanosheet FETsSCIESCOPUS

IEEE ELECTRON DEVICE LETTERS, vol. 39, no. 12, page. 1840 - 1843, 2018-12

Article

Impact of geometrical parameters on the electrical performance of network-channel polycrystalline silicon thin-film transistorsSCIESCOPUS

JAPANESE JOURNAL OF APPLIED PHYSICS, vol. 57, no. 10, 2018-10

Article

Analog Figure-of-Merits Comparison of Gate Workfunction Variability and Random Discrete Dopant Between Inversion-Mode and Junctionless Nanowire FETsSCIE

JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, vol. 18, no. 9, page. 6598 - 6601, 2018-09

Article

Threshold voltage variation depending on single grain boundary and stored charges in an adjacent cell for vertical silicon-oxide-nitride-oxide-silicon (SONOS) NAND flash memorySCIESCOPUS

JAPANESE JOURNAL OF APPLIED PHYSICS, vol. 57, no. 4S, 2018-04

Article

Systematic analysis of oxide trap distribution of 4H-SiC DMOSFETs using TSCIS and its correlation with BTI and SILC behaviorSCIESCOPUS

SOLID-STATE ELECTRONICS, vol. 140, page. 18 - 22, 2018-02

Article

Work function consideration in vacuum field emission transistor designSCIESCOPUS

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, vol. 35, no. 6, 2017-11

Article

Investigation of Hot-Carrier Reliability in Junctionless Polysilicon Thin-Film TransistorsSCIESCOPUS

JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, vol. 17, no. 5, page. 3375 - 3377, 2017-05

Article

Buffer effects of two functional groups against pH variation at aminosilanized Electrolyte-Oxide-Semiconductor (EOS) capacitorSCIESCOPUS

Sensors and Actuators B: Chemical, vol. 242, page. 324 - 331, 2017-04

Article

Electrical characteristics of tunneling field-effect transistors with asymmetric channel thicknessSCIESCOPUS

JAPANESE JOURNAL OF APPLIED PHYSICS, vol. 56, no. 2, page. 024201-1 - 024201-5, 2017-01

Article

Highly Enhanced Performance of Network-Channel Polysilicon Thin-Film TransistorsSCIESCOPUS

IEEE Electron Device Letters, no. 99, 2016-12

Article

Design guidelines for nanoscale vacuum field emission transistorsSCIESCOPUS

Journal of Vacuum Science & Technology B, vol. 34, no. 4, 2016-07

Article

A Reconfigurable and Portable Highly Sensitive Biosensor Platform for ISFET and Enzyme-based SensorsSCIESCOPUS

IEEE Sensors Journal, vol. 16, no. 11, page. 4443 - 4451, 2016-06-01

Article

Electrical Characteristics of Top-Gated Graphene Field Effect Transistors Fabricated on Stainless Steel (STS) SubstrateSCIESCOPUS

Journal of Nanoscience and Nanotechnology, vol. 16, no. 5, page. 5159 - 5163, 2016-05

Article

Silicon Nanowire Biosensors for Detection of Cardiac Troponin I (cTnI) with High SensitivitySCIESCOPUS

Biosensors and Bioelectronics, vol. 77, page. 695 - 701, 2016-03-15

Article

Effects of single grain boundary and random interface traps on electrical variations of sub-30 nm polysilicon nanowire structuresSCIESCOPUS

MICROELECTRONIC ENGINEERING, vol. 149, page. 113 - 116, 2016-01-05

Article

Investigation of RC Parasitics Considering Middle-of-the-Line in Si-Bulk FinFETs for Sub-14-nm Node Logic ApplicationsSCIESCOPUS

IEEE TRANSACTIONS ON ELECTRON DEVICES, vol. 62, no. 10, page. 3441 - 3444, 2015-10

Article

Junction Design Strategy for Si Bulk FinFETs for System-on-Chip Applications Down to the 7-nm NodeSCIESCOPUS

IEEE ELECTRON DEVICE LETTERS, vol. 36, no. 10, page. 994 - 996, 2015-10

Article

Three-dimensional simulation of threshold voltage variations due to an oblique single grain boundary in sub-40nm polysilicon nanowire FETsSCIESCOPUS

SEMICONDUCTOR SCIENCE AND TECHNOLOGY, vol. 30, no. 8, 2015-08

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