Soft Error in Saddle Fin Based DRAM
SCIE
SCOPUS
- Title
- Soft Error in Saddle Fin Based DRAM
- Authors
- Han, J.-W.; Kim, J.; Moon, D.-I.; Lee, J.-S.; Meyyappan, M.
- Date Issued
- 2019-04
- Publisher
- Institute of Electrical and Electronics Engineers
- Abstract
- Soft error effects due to the alpha particle and terrestrial neutron strike are investigated in a saddle fin DRAM using the 3D TCAD simulation. The strike location and angle dependency are investigated, and the worst-case incidence condition is studied. As the strike time is relevant for the error pattern, the strike during the write period is found to have minor effect, but the strike during the hold period shows data corruption. The inter-active disturbance is effectivelysuppresseddue to the shallowtrenchisolation, but the inter-active ionizing radiation disturbance can be a potential risk as the capacitance of the storage capacitor continues to reduce with the DRAM technology scaling.
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/100312
- DOI
- 10.1109/LED.2019.2897685
- ISSN
- 0741-3106
- Article Type
- Article
- Citation
- IEEE Electron Device Letters, vol. 40, no. 4, page. 494 - 497, 2019-04
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- There are no files associated with this item.
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