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Robust Level Converter for Sub-Threshold/Super-Threshold Operation: 100 mV to 2.5 V SCIE SCOPUS

Title
Robust Level Converter for Sub-Threshold/Super-Threshold Operation: 100 mV to 2.5 V
Authors
Ik-Joon ChangKim, JJKeejong KimKaushik Roy
Date Issued
2011-08
Publisher
IEEE
Abstract
For ultra low power application, digital sub-threshold logic design has been explored. Extremely low power supply (VDD) of sub-threshold logic results in significant power reduction. However, it is difficult to convert signals from core logic to input/output (I/O) circuits since core VDD is vastly different from high I/O supply voltage. In this work, we propose a level converter based on dynamic logic style for sub-threshold I/O part, having a large dynamic range of conversion. For the level converter, high voltage clock signal needs to be delivered through separate clock path from core logic, leading to clock synchronization problem between high voltage and low voltage clocks. To overcome this issue, we employed a Clock Synchronizer. A test chip is fabricated in 130-nm CMOS technology in order to verify the proposed technique. Hardware measurement results show that the level converter successfully converts 0.3 V 8 MHz pulse to 2.5 V signal.
Keywords
Level converter; subthreshold logic; subthreshold operation; ultra-low voltage operation; VOLTAGE; DESIGN
URI
https://oasis.postech.ac.kr/handle/2014.oak/14741
DOI
10.1109/TVLSI.2010.2051240
ISSN
1063-8210
Article Type
Article
Citation
IEEE Trans. on VLSI Systems, vol. 19, no. 8, page. 1429 - 1437, 2011-08
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김재준KIM, JAE JOON
Dept. Convergence IT Engineering
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