OASIS Repository@POSTECHLIBRARY: JE, JUNG HO(JUNG HO)

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Article

X-ray bright-field imaging analyzes crystalline quality and defects of SiC wafersSCIESCOPUS

JOURNAL OF APPLIED CRYSTALLOGRAPHY, vol. 40, page. 376 - 378, 2007-04

Yi, JM;
Chu, YS;
Zhong, Y;
Je, JH;
Hwu, Y;

Article

Real-time radiology in the microscaleSCIESCOPUS

CHINESE JOURNAL OF PHYSICS, vol. 43, no. 1, page. 285 - 292, 2005-10-01

Hwu, Y;
Je, JH;
Margaritondo, G

Article

Collimation-enhanced micro-radiography in real-timeSCIESCOPUS

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, vol. 467, page. 1294 - 1300, 2001-07-21

Hwu, Y;
Tsai, WL;
Hsieh, HH;
Je, JH;
Kang, HS;

Article

Using photoelectron emission microscopy with hard-X-raysSCIESCOPUS

SURFACE SCIENCE, vol. 480, no. 3, page. 188 - 195, 2001-06-01

Hwu, Y;
Tsai, WL;
Lai, B;
Je, JH;
Fecher, GH;

Article

Use of photoelectron microscopes as X-ray detectors for imaging and other applicationsSCIESCOPUS

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, vol. 437, no. 2-3, page. 516 - 520, 1999-11-21

Hwu, Y;
Tsai, WL;
Lai, B;
Mancini, DC;
Je, JH;

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