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Use of photoelectron microscopes as X-ray detectors for imaging and other applications SCIE SCOPUS
- Title
- Use of photoelectron microscopes as X-ray detectors for imaging and other applications
- Authors
- Hwu, Y; Tsai, WL; Lai, B; Mancini, DC; Je, JH; Noh, DY; Youn, HS; Hwang, CS; Cerrina, F; Swiech, W; Bertolo, M; Tromba, G; Margaritondo, G
- Date Issued
- 1999-11-21
- Publisher
- ELSEVIER SCIENCE BV
- Abstract
- We demonstrate with practical tests that a photoelectron emission microscope (PEEM) can be advantageously used as a high-lateral-resolution detector of X-rays. The advantages of this approach are discussed, in particular for coherence-based techniques. (C) 1999 Published by Elsevier Science B.V. All rights reserved.
- Keywords
- SYNCHROTRON-RADIATION; SPECTROMICROSCOPY; CONTRAST; RESOLUTION; MEPHISTO; SURFACES
- ISSN
- 0168-9002
- Article Type
- Article
- Citation
- NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, vol. 437, no. 2-3, page. 516 - 520, 1999-11-21
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Related Researcher
- 제정호JE, JUNG HO
- Dept of Materials Science & Enginrg