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BAEK, ROCK HYUN(백록현)
scopus
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Dept of Electrical Engineering(전자전기공학과)
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Publication & Time Cited Count (For the Last 5 years)
Results 1-1 of 1 (Search time: 0.001 seconds).
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Date issued
2019
1
Type
Article
1
Subject
5-nm node
1
FinFETs
1
longitudinal channel stress
1
performance-power-area
1
ring oscillator
1
source/drain patterning
1
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SCIE
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SCOPUS
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: FinFETs
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: FinFETs
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: longitudinal channel stress
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Article
Source/Drain Patterning FinFETs as Solution for Physical Area Scaling Toward 5-nm Node
SCIE
SCOPUS
IEEE ACCESS, vol. 7, page. 172290 - 172295, 2019-12
BAEK, ROCK HYUN
;
YOON, JUN SIK
;
SEUNGHWAN, LEE
;
JINSU, JEONG
;
YUN, HYEOK
;
et al
1
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