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BAEK, ROCK HYUN(백록현) scopus
Department
Dept of Electrical Engineering(전자전기공학과)
Major(s)
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Co-researchers

    Keyword

    Publication & Time Cited Count (For the Last 5 years)

    Results 1-20 of 65 (Search time: 0.003 seconds).
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    Conference
    Channel Trimming Process to Improve Electro-thermal Characteristics for Sub-3-nm Node Nanosheet Field-Effect Transistors with Laser Spike Annealing

    2023 International Conference on Solid State Devices and Materials (SSDM), 2023-09-08

    Conference
    Holistic Analysis of Asymmetry in Vertical Silicon Gate-all-around Nanosheet FETs

    2023 International Conference on Solid State Devices and Materials (SSDM), 2023-09-08

    Conference
    Front-side and Back-side Power Delivery Network Guidelines for 2nm node High Perf Computing and Mobile SoC applications

    2023 Symposium on VLSI Technology and Circuits, 2023-06-13

    Conference
    Study of continuous-wave RGB laser annealing for the activation of phosphorus/boron-doped Si deep junction with high scan speed

    The 7th Electron Devices Technology and Manufacturing Conference (IEEE EDTM 2023), 2023-03-09

    Conference
    Optimization of Ge Mole Fraction in Sacrificial Layers for Sub-3-nm Node Silicon Nanosheet FETs

    The 7th Electron Devices Technology and Manufacturing Conference (IEEE EDTM 2023), 2023-03-09

    Conference
    High-Speed Ternary CMOS Inverter by Monolithic Integration of NbO2 Threshold Switch with MOSFET

    2021 IEEE International Electron Devices Meeting, 2021-12-15

    Conference
    Optimal Energetic Trap Distribution of Charge Trap Nitride for Wider Vth Window in 3D NAND Flash Using Machine Learning Methodology

    2021 International Conference on Solid State Devices and Materials, 2021-09-08

    Conference
    SRAM Performance Variations Induced by Source/Drain Mole Fraction Change of Sub 5-nm Node Silicon Nanosheet Field-Effect Transistors

    The 18th International Nanotech Symposium & Exhibition, 2020-07-01

    Conference
    TSV-to-Transistor Noise Coupling Characterizations for Sub 5-nm Node Fin- and Nanosheet FETs in 3D-IC

    The 18th International Nanotech Symposium & Exhibition, 2020-07-01

    Conference
    Interface trap curing effects on high-k gate stack (Al/Al2O3/Si-sub) by rapid thermal anneal (RTA)

    The 18th International Nanotech Symposium & Exhibition, 2020-07-01

    Conference
    Neural Network Based 14-nm Node Fully-Depleted FET Design for AC Applications of SoC and 3DIC

    The 18th International Nanotech Symposium & Exhibition, 2020-07-01

    Conference
    Electrical and Dielectric Properties of TiO2 Based MIS Capacitor

    The 18th International Nanotech Symposium & Exhibition, 2020-07-01

    Conference
    Neural Network Based Design Optimization of 14-nm Node Fully-Depleted SOI FET for SoC and 3DIC applications

    4th IEEE Electron Devices Technology and Manufacturing (EDTM) Conference 2020, 2020-03-17

    Conference
    Impact of Thermo-Mechanical Stress Induced by Through-Silicon Vias on Performance Variations of 5-nm Node Si-Nanosheet FETs

    the 17th International Nanotech Symposium & Exhibition, 2019-07-04

    Conference
    Scalability of OTS Integrated PCM for 3-D Stackable Cross-point Array Structure Using TCAD Simulation

    the 17th International Nanotech Symposium & Exhibition, 2019-07-04

    Conference
    Comparison of virtual source velocity and apparent mobility in shrunk Lg=15 nm n/p-SNWFETs with various channel diameters

    the 17th International Nanotech Symposium & Exhibition, 2019-07-04

    Conference
    Extensive Analysis of Incremental Step Programming Pulse (ISPP) Slope Degradation in NAND Flash Memory

    the 17th International Nanotech Symposium & Exhibition, 2019-07-04

    Conference
    Critical dimension variations of sub 5-nm node fin and nanosheet FETs

    the 17th International Nanotech Symposium & Exhibition, 2019-07-03

    Conference
    The Effects of Realistic U-shaped Source/Drain on DC/AC Performances of Silicon Nanosheet FETs for Sub 5-nm Node SoC Applications

    2019 IEEE Electron Devices Technology and Manufacturing Conference (EDTM), page. 133 - 135, 2019-03-14

    Conference
    Nanosheet Number and Width Optimization of Multi Stacked NanoSheet FET for 7-nm Node SoC Application

    2018 International Conference on Solid State Devices and Materials (SSDM 2018), page. 877 - 878, 2018-09-12

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