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Characterization of a single step microstrip discontinuity in the substrate using the 3D-FDTD method
- Title
- Characterization of a single step microstrip discontinuity in the substrate using the 3D-FDTD method
- Authors
- 박위상
- Date Issued
- 1996-08-01
- Article Type
- Conference
- Citation
- 1996 Korea-Japan Joint Conference, page. 61 - 65, 1996-08-01
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Related Researcher
- 박위상PARK, WEE SANG
- Dept of Electrical Enginrg