Conference
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 박위상 | - |
| dc.date.accessioned | 2018-06-21T12:58:33Z | - |
| dc.date.available | 2018-06-21T12:58:33Z | - |
| dc.date.created | 2009-03-27 | - |
| dc.date.issued | 1996-08-01 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/81977 | - |
| dc.relation.isPartOf | 1996 Korea-Japan Joint Conference | - |
| dc.relation.isPartOf | 1996 Korea-Japan Joint Conference | - |
| dc.title | Characterization of a single step microstrip discontinuity in the substrate using the 3D-FDTD method | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | 1996 Korea-Japan Joint Conference, pp.61 - 65 | - |
| dc.citation.endPage | 65 | - |
| dc.citation.startPage | 61 | - |
| dc.citation.title | 1996 Korea-Japan Joint Conference | - |
| dc.contributor.affiliatedAuthor | 박위상 | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
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Related Researcher
- 박위상PARK, WEE SANG
- Dept of Electrical Enginrg