The Statistical Distribution of Electrical Characteristics with Random Grain Boundary in Vertical NAND Unit Cells
- Title
- The Statistical Distribution of Electrical Characteristics with Random Grain Boundary in Vertical NAND Unit Cells
- Authors
- 이정수
- Date Issued
- 2015-02-11
- Publisher
- KCS
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/70045
- Article Type
- Conference
- Citation
- The 22th Korean Conference on Semiconductors (KCS 2015), 2015-02-11
- Files in This Item:
- There are no files associated with this item.
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