Conference
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 이정수 | - |
| dc.date.accessioned | 2018-06-19T01:41:11Z | - |
| dc.date.available | 2018-06-19T01:41:11Z | - |
| dc.date.created | 2015-12-30 | - |
| dc.date.issued | 2015-02-11 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/70045 | - |
| dc.publisher | KCS | - |
| dc.relation.isPartOf | The 22th Korean Conference on Semiconductors (KCS 2015) | - |
| dc.title | The Statistical Distribution of Electrical Characteristics with Random Grain Boundary in Vertical NAND Unit Cells | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | The 22th Korean Conference on Semiconductors (KCS 2015) | - |
| dc.citation.conferenceDate | 2015-02-10 | - |
| dc.citation.conferencePlace | KO | - |
| dc.citation.title | The 22th Korean Conference on Semiconductors (KCS 2015) | - |
| dc.contributor.affiliatedAuthor | 이정수 | - |
| dc.description.journalClass | 2 | - |
| dc.description.journalClass | 2 | - |
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Related Researcher
- 이정수LEE, JEONG SOO
- Dept of Electrical Enginrg