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Effects of Grain Boundary Traps on Electrical Variation in 3D Vertical NAND Flash Memory Cell with Macaroni Channel Structure
- Title
- Effects of Grain Boundary Traps on Electrical Variation in 3D Vertical NAND Flash Memory Cell with Macaroni Channel Structure
- Authors
- 이정수
- Date Issued
- 2014-07-02
- Publisher
- Nano Korea symposium
- Article Type
- Conference
- Citation
- The 12th Nano Korea symposium, 2014-07-02
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Related Researcher
- 이정수LEE, JEONG SOO
- Dept of Electrical Enginrg