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2-D strain and charge density mapping using inline electron holography with a sub-nanometer resolution
- Title
- 2-D strain and charge density mapping using inline electron holography with a sub-nanometer resolution
- Authors
- 오상호; 송경; Christoph T. Koch; 김동영; 김종규
- Date Issued
- 2013-06-25
- Publisher
- LED EXPO
- Article Type
- Conference
- Citation
- International LED and Green lighting conference 2013, 2013-06-25
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Related Researcher
- 오상호OH, SANG HO
- Dept of Materials Science & Enginrg