2-D strain and charge density mapping using inline electron holography with a sub-nanometer resolution
- Title
- 2-D strain and charge density mapping using inline electron holography with a sub-nanometer resolution
- Authors
- 오상호; 송경; Christoph T. Koch; 김동영; 김종규
- Date Issued
- 2013-06-25
- Publisher
- LED EXPO
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/66710
- Article Type
- Conference
- Citation
- International LED and Green lighting conference 2013, 2013-06-25
- Files in This Item:
- There are no files associated with this item.
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