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dc.contributor.author오상호-
dc.contributor.author송경-
dc.contributor.authorChristoph T. Koch-
dc.contributor.author김동영-
dc.contributor.author김종규-
dc.date.accessioned2018-06-18T10:54:06Z-
dc.date.available2018-06-18T10:54:06Z-
dc.date.created2014-03-20-
dc.date.issued2013-06-25-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/66710-
dc.publisherLED EXPO-
dc.relation.isPartOfInternational LED and Green lighting conference 2013-
dc.title2-D strain and charge density mapping using inline electron holography with a sub-nanometer resolution-
dc.typeConference-
dc.type.rimsCONF-
dc.identifier.bibliographicCitationInternational LED and Green lighting conference 2013-
dc.citation.conferenceDate2013-06-25-
dc.citation.conferencePlaceKO-
dc.citation.titleInternational LED and Green lighting conference 2013-
dc.contributor.affiliatedAuthor오상호-
dc.contributor.affiliatedAuthor송경-
dc.description.journalClass2-
dc.description.journalClass2-

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오상호OH, SANG HO
Dept of Materials Science & Enginrg
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