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The Effect of Bias-Temperature Stress on Threshold Voltage Instabilities in a-IGZO under Light Illumination and their Modeling Equation
- Title
- The Effect of Bias-Temperature Stress on Threshold Voltage Instabilities in a-IGZO under Light Illumination and their Modeling Equation
- Date Issued
- 2013-09-18
- Publisher
- SID
- Article Type
- Conference
- Citation
- EuroDisplay 2013, 2013-09-18
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Related Researcher
- 김오현KIM, OHYUN
- Dept of Electrical Enginrg