The Effect of Bias-Temperature Stress on Threshold Voltage Instabilities in a-IGZO under Light Illumination and their Modeling Equation
- Title
- The Effect of Bias-Temperature Stress on Threshold Voltage Instabilities in a-IGZO under Light Illumination and their Modeling Equation
- Authors
- 김오현; 석수정
- Date Issued
- 2013-09-18
- Publisher
- SID
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/66670
- Article Type
- Conference
- Citation
- EuroDisplay 2013, 2013-09-18
- Files in This Item:
- There are no files associated with this item.
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