Conference
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 김오현 | - |
| dc.contributor.author | 석수정 | - |
| dc.date.accessioned | 2018-06-18T10:52:01Z | - |
| dc.date.available | 2018-06-18T10:52:01Z | - |
| dc.date.created | 2014-03-20 | - |
| dc.date.issued | 2013-09-18 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/66670 | - |
| dc.publisher | SID | - |
| dc.relation.isPartOf | EuroDisplay 2013 | - |
| dc.relation.isPartOf | 33TH INTERNATIONAL DISPLAY RESEARCH CONFERENCE | - |
| dc.title | The Effect of Bias-Temperature Stress on Threshold Voltage Instabilities in a-IGZO under Light Illumination and their Modeling Equation | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | EuroDisplay 2013 | - |
| dc.citation.conferenceDate | 2013-09-16 | - |
| dc.citation.conferencePlace | UK | - |
| dc.citation.title | EuroDisplay 2013 | - |
| dc.contributor.affiliatedAuthor | 김오현 | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
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Related Researcher
- 김오현KIM, OHYUN
- Dept of Electrical Enginrg