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Bias-Stress Induced Charge Trapping at Polymer Gate-Dielectric in Organic Field-Effect Transistors
- Title
- Bias-Stress Induced Charge Trapping at Polymer Gate-Dielectric in Organic Field-Effect Transistors
- Authors
- 조길원
- Date Issued
- 2012-05-14
- Publisher
- European Materials Research Society
- Article Type
- Conference
- Citation
- 2012 EMRS Spring meeting, 2012-05-14
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Related Researcher
- 조길원CHO, KIL WON
- Dept. of Chemical Enginrg