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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 조길원 | - |
| dc.date.accessioned | 2018-06-18T07:47:20Z | - |
| dc.date.available | 2018-06-18T07:47:20Z | - |
| dc.date.created | 2013-03-29 | - |
| dc.date.issued | 2012-05-14 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/63974 | - |
| dc.publisher | European Materials Research Society | - |
| dc.relation.isPartOf | 2012 EMRS Spring meeting | - |
| dc.title | Bias-Stress Induced Charge Trapping at Polymer Gate-Dielectric in Organic Field-Effect Transistors | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | 2012 EMRS Spring meeting | - |
| dc.citation.title | 2012 EMRS Spring meeting | - |
| dc.contributor.affiliatedAuthor | 조길원 | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
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Related Researcher
- 조길원CHO, KIL WON
- Dept. of Chemical Enginrg