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Analysis of Bias-Stress-Induced Charge Trapping in Organic Transistors
- Title
- Analysis of Bias-Stress-Induced Charge Trapping in Organic Transistors
- Authors
- 조길원
- Date Issued
- 2012-12-21
- Publisher
- A-COE
- Article Type
- Conference
- Citation
- A-COE 2012, 2012-12-21
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Related Researcher
- 조길원CHO, KIL WON
- Dept. of Chemical Enginrg