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dc.contributor.author조길원-
dc.date.accessioned2018-06-18T07:41:10Z-
dc.date.available2018-06-18T07:41:10Z-
dc.date.created2013-03-29-
dc.date.issued2012-12-21-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/63859-
dc.publisherA-COE-
dc.relation.isPartOfA-COE 2012-
dc.titleAnalysis of Bias-Stress-Induced Charge Trapping in Organic Transistors-
dc.typeConference-
dc.type.rimsCONF-
dc.identifier.bibliographicCitationA-COE 2012-
dc.citation.titleA-COE 2012-
dc.contributor.affiliatedAuthor조길원-
dc.description.journalClass1-
dc.description.journalClass1-

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조길원CHO, KIL WON
Dept. of Chemical Enginrg
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