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Analysis of Bias-Stress-Induced Charge Trapping in Organic Transistors

Title
Analysis of Bias-Stress-Induced Charge Trapping in Organic Transistors
Authors
조길원
POSTECH Authors
조길원
Date Issued
21-Dec-2012
Publisher
A-COE
URI
http://oasis.postech.ac.kr/handle/2014.oak/63859
Article Type
Conference
Citation
A-COE 2012, 2012-12-21
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조길원CHO, KIL WON
Dept. of Chemical Enginrg
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