Channel width dependence of mechanical stress effects induced by shallow
- Title
- Channel width dependence of mechanical stress effects induced by shallow
- Authors
- 강봉구; 이선행
- Date Issued
- 2012-10-01
- Publisher
- Microelectronics Reliability
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/62644
- Article Type
- Conference
- Citation
- European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2012-10-01
- Files in This Item:
- There are no files associated with this item.
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