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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 강봉구 | - |
| dc.contributor.author | 이선행 | - |
| dc.date.accessioned | 2018-06-18T06:03:25Z | - |
| dc.date.available | 2018-06-18T06:03:25Z | - |
| dc.date.created | 2013-02-28 | - |
| dc.date.issued | 2012-10-01 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/62644 | - |
| dc.publisher | Microelectronics Reliability | - |
| dc.relation.isPartOf | European Symposium on Reliability of Electron Devices, Failure Physics and Analysis | - |
| dc.title | Channel width dependence of mechanical stress effects induced by shallow | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | European Symposium on Reliability of Electron Devices, Failure Physics and Analysis | - |
| dc.citation.conferencePlace | IT | - |
| dc.citation.title | European Symposium on Reliability of Electron Devices, Failure Physics and Analysis | - |
| dc.contributor.affiliatedAuthor | 강봉구 | - |
| dc.contributor.affiliatedAuthor | 이선행 | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
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Related Researcher
- 강봉구KANG, BONG KOO
- Dept of Electrical Enginrg