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Gate bias stress effect in organic field effect transistors for various functional groups of dielectric layer

Title
Gate bias stress effect in organic field effect transistors for various functional groups of dielectric layer
Authors
박찬언김지예김세현박미정박선욱
POSTECH Authors
박찬언
Date Issued
8-Apr-2011
Publisher
한국고분자학회
URI
http://oasis.postech.ac.kr/handle/2014.oak/60800
Article Type
Conference
Citation
2011 춘계학술대회, 2011-04-08
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박찬언PARK, CHAN EON
Dept. of Chemical Enginrg
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