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Gate bias stress effect in organic field effect transistors for various functional groups of dielectric layer
- Title
- Gate bias stress effect in organic field effect transistors for various functional groups of dielectric layer
- Date Issued
- 2011-04-08
- Publisher
- 한국고분자학회
- Article Type
- Conference
- Citation
- 2011 춘계학술대회, 2011-04-08
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Related Researcher
- 박찬언PARK, CHAN EON
- Dept. of Chemical Enginrg