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dc.contributor.author박찬언ko
dc.contributor.author김지예ko
dc.contributor.author김세현ko
dc.contributor.author박미정ko
dc.contributor.author박선욱ko
dc.date.accessioned2018-06-18T03:50:40Z-
dc.date.available2018-06-18T03:50:40Z-
dc.date.created2012-03-26-
dc.date.issued2011-04-08-
dc.identifier.citation2011 춘계학술대회-
dc.identifier.urihttp://oasis.postech.ac.kr/handle/2014.oak/60800-
dc.publisher한국고분자학회-
dc.titleGate bias stress effect in organic field effect transistors for various functional groups of dielectric layer-
dc.typeConference-
dc.type.rimsCONF-
dc.contributor.localauthor박찬언-
dc.contributor.nonIdAuthor김지예-
dc.contributor.nonIdAuthor김세현-
dc.contributor.nonIdAuthor박미정-
dc.contributor.nonIdAuthor박선욱-
dc.citation.title2011 춘계학술대회-
dc.description.journalClass2-
dc.identifier.conferencecountryKO-

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박찬언PARK, CHAN EON
Dept. of Chemical Enginrg
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