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Improving the Process Variation Tolerability of Flip-Flops for UDSM Circuit Design
- Title
- Improving the Process Variation Tolerability of Flip-Flops for UDSM Circuit Design
- Date Issued
- 2010-05-24
- Publisher
- ISQED
- Article Type
- Conference
- Citation
- The 11th International Symposium on Quality Electronic Design (ISQED 2010), page. 812 - 817, 2010-05-24
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Related Researcher
- 김영환KIM, YOUNG HWAN
- Dept of Electrical Enginrg