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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 김영환 | - |
| dc.contributor.author | 황은주 | - |
| dc.contributor.author | 김욱 | - |
| dc.date.accessioned | 2018-06-17T10:18:40Z | - |
| dc.date.available | 2018-06-17T10:18:40Z | - |
| dc.date.created | 2011-03-25 | - |
| dc.date.issued | 2010-05-24 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/57325 | - |
| dc.publisher | ISQED | - |
| dc.relation.isPartOf | The 11th International Symposium on Quality Electronic Design (ISQED 2010) | - |
| dc.relation.isPartOf | THE 11TH INTERNATIONAL SYMPOSIUM ON QUALITY ELECTRONIC DESIGN | - |
| dc.title | Improving the Process Variation Tolerability of Flip-Flops for UDSM Circuit Design | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | The 11th International Symposium on Quality Electronic Design (ISQED 2010), pp.812 - 817 | - |
| dc.citation.conferenceDate | 2010-05-22 | - |
| dc.citation.conferencePlace | US | - |
| dc.citation.endPage | 817 | - |
| dc.citation.startPage | 812 | - |
| dc.citation.title | The 11th International Symposium on Quality Electronic Design (ISQED 2010) | - |
| dc.contributor.affiliatedAuthor | 김영환 | - |
| dc.contributor.affiliatedAuthor | 황은주 | - |
| dc.contributor.affiliatedAuthor | 김욱 | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
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Related Researcher
- 김영환KIM, YOUNG HWAN
- Dept of Electrical Enginrg