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RF characteristics in Metal Gate/High-K Dielectric nMOSFETs at cryogenic temperature
- Title
- RF characteristics in Metal Gate/High-K Dielectric nMOSFETs at cryogenic temperature
- Date Issued
- 2009-02-18
- Publisher
- 대한전자공학회
- Article Type
- Conference
- Citation
- 16th Korean Conference on Semiconductors (2009), 2009-02-18
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Related Researcher
- 백록현BAEK, ROCK HYUN
- Dept of Electrical Enginrg