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RF performance degradation in 100-nm metal gate/high-k dielectric nMOSFET by hot carrier effects
- Title
- RF performance degradation in 100-nm metal gate/high-k dielectric nMOSFET by hot carrier effects
- Date Issued
- 2009-09-14
- Publisher
- IEEE
- Article Type
- Conference
- Citation
- ESSDERC 2009, 2009-09-14
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Related Researcher
- 백록현BAEK, ROCK HYUN
- Dept of Electrical Enginrg