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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 백록현 | - |
| dc.contributor.author | 사공현철 | - |
| dc.contributor.author | 이경택 | - |
| dc.contributor.author | 강창용 | - |
| dc.contributor.author | 최길복 | - |
| dc.contributor.author | 최현식 | - |
| dc.contributor.author | 박민상 | - |
| dc.contributor.author | 정성우 | - |
| dc.contributor.author | 정윤하 | - |
| dc.date.accessioned | 2018-05-24T11:44:02Z | - |
| dc.date.available | 2018-05-24T11:44:02Z | - |
| dc.date.created | 2017-03-01 | - |
| dc.date.issued | 2009-09-14 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/49828 | - |
| dc.publisher | IEEE | - |
| dc.relation.isPartOf | ESSDERC 2009 | - |
| dc.relation.isPartOf | SOLID STATE DEVICE RESEARCH CONFERENCE, 2009. ESSDERC '09. PROCEEDINGS OF THE EUROPEAN | - |
| dc.title | RF performance degradation in 100-nm metal gate/high-k dielectric nMOSFET by hot carrier effects | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | ESSDERC 2009 | - |
| dc.citation.conferencePlace | GR | - |
| dc.citation.title | ESSDERC 2009 | - |
| dc.contributor.affiliatedAuthor | 백록현 | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
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Related Researcher
- 백록현BAEK, ROCK HYUN
- Dept of Electrical Enginrg