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Electrostatics and Performance Benchmarking using all Types of III-V Multi-Gate FinFETs for sub 7nm Technology Node Logic Application
- Title
- Electrostatics and Performance Benchmarking using all Types of III-V Multi-Gate FinFETs for sub 7nm Technology Node Logic Application
- Authors
- 백록현; 김태우; T.Michalak; C.Borst; 신찬수; 박원규; 송승철; G.Yeap; R.Hill; C.Hobbs; W.Maszara; 김대현; P.Kirsch
- Date Issued
- 2014-06-09
- Publisher
- IEEE
- Article Type
- Conference
- Citation
- International Symposium on VLSI Technology (VLSI2014), 2014-06-09
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Related Researcher
- 백록현BAEK, ROCK HYUN
- Dept of Electrical Enginrg