Open Access System for Information Sharing

Login Library

 

Conference
Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

In-situ Synchrotron X-ray Diffraction measurement of Epitaxial FeRh Thin Films

Title
In-situ Synchrotron X-ray Diffraction measurement of Epitaxial FeRh Thin Films
Authors
권순주장성욱김지홍박기훈현승민이환수
Date Issued
2009-12-06
Publisher
한국자기학회
URI
https://oasis.postech.ac.kr/handle/2014.oak/44322
Article Type
Conference
Citation
한국자기학회, 2009-12-06
Files in This Item:
There are no files associated with this item.

qr_code

  • mendeley

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher

권순주KWON, SOON JU
Dept of Materials Science & Enginrg
Read more

Views & Downloads

Browse