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KWON, SOON JU (권순주)

Dept of Materials Science & Engineering(신소재공학과)

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Mossbauer spectroscopy:4||MAGNETICPROPERTIES:4||OXIDATION:3||STEEL:3||RETAINED AUSTENITE:2||CORROSION:2||FILMS:2||EXISTENCE:2||FEOOH:2||GETTER:2||PD:2||MANGANITES:2||plain carbon steel:2||IRONALLOYS:2||DUCTILITY:2||PHOTOELECTRON:2||CARBON:2||TRIP STEELS:2||TRANSITIONMETALS:2||MARTENSITE:2||VALENCEBAND SATELLITE:2||TiB2/steel surfacealloyed material:2||SHEET:2||AUGERSPECTRA:2||MANGANESE OXIDES:2||highenergy electron beam:2||DUALPHASE STEEL:2||gray cast iron:2||atomic layer deposition:2||THINFILMS:2||ZR METALLIC GLASSES:2||Permalloy:1||ANISOTROPY:1||texture:1||FeOOH:1||particle size:1||COERCIVITY:1||Mossbauer effect:1||fluorine dissolution:1||IMMOBILIZATION MECHANISM:1||BEHAVIOR:1||TRANSPARENT CONDUCTING OXIDES:1||METAL:1||surface analysis:1||XAFS SPECTROSCOPY:1||COPPER:1||PLATINUM:1||IFEFFIT:1||annealing:1||synchrotron radiation:1||Ta addition:1||zinciron:1||hyperfine field:1||ferromagnetic and antiferromagentic transition:1||Brownmillerite:1||oxygen partial pressure:1||CaOFetOAl2O3CaF2 system:1||chemical vapor condensation:1||electronic structure:1||COLOSSAL MAGNETORESISTANCE:1||conductivity:1||CHARGED SURFACES:1||POLYPYRROLE:1||POLYELECTROLYTES:1||steels:1||oxidation:1||sulfur dioxide:1||CARBONATE:1||GALVANNEALED COATINGS:1||transparent TFT:1||METALELECTRODES:1||CO ADSORPTION:1||Magnetic field:1||Grazing Incidence Xray Diffraction:1||thin filmssputtered:1||Xray diffraction:1||Magnetization value:1||MAGNETIC FORCE MICROSCOPY:1||LOCATION:1||SPECTRA:1||MANIPULATION:1||FERROUS HYDROXIDE:1||PRODUCTS:1||miscellaneous:1||CO adsorption:1||BINDINGENERGY:1||sputtering:1||XRF:1||CoCrPt thin film:1||scanning electron microscopy:1||ALPHAFEB:1||steelmaking slag:1||MFM:1||RECORDING MEDIA:1||RAREEARTHOXIDES:1||COREHOLE:1||LA1XSRXMNO3:1||nanostructures:1||xray diffraction:1||GREEN RUST ONE:1||DIAGRAMS:1||intermetallics:1||transparent conducting oxides:1||rf sputtering:1||ROOMTEMPERATURE:1||XAFS:1||steel:1||effective medium model:1||DEFORMATION:1||GYPSUM:1||Co90Fe10:1||HEXAGONAL FERRITE:1||PARTICLES:1||POWDERS:1||SIZE:1||mixedvalence:1||CMR manganites:1||XRAY PHOTOEMISSION:1||polymers:1||ULTRATHIN MULTILAYER FILMS:1||ADSORPTION:1||Aldoped ZnO films:1||copper:1||ELECTROCHEMICAL REDUCTION:1||DIOXIDE:1||ferromagnetic materials:1||FePt thin film:1||High Ku materials:1||XRAYDIFFRACTION:1||SURFACE:1||transition metalternary compounds:1||superparamagnetism:1||longitudinal recording media:1||COLOSSALMAGNETORESISTANCE:1||B ALLOYS:1||interdiffusion:1||FCI:1||FeCo nanoparticle:1||superparamagnetism:1||DEPOSITION:1||BUILDUP:1||ELECTRICALPROPERTIES:1||EPITAXY:1||GROWTH:1||EXAFS:1||ABSORPTION FINESTRUCTURE:1||Electron beam evaporation:1||OXIDE LAYER:1||FILM:1||goethite:1||cementite dissolution:1||RESISTIVITY:1||LA0.7CA0.3MNO3:1||FePtTa:1||FeRh/FePtTa bilayer:1||CNT probe:1||average particle size:1||magnetic property:1||IRONOXIDES:1||photoelectron spectroscopy:1||MEDIA:1||PULSEDLASER DEPOSITION:1||ZINCOXIDE:1||ORIENTATION:1||grain growth:1||XRAY:1||ALLOYS:1||Magnetic anisotropy:1||IRON PARTICLES:1||alloying coating:1||hcp underlayer:1||magnetic phase transition:1||colossal magnetoresistance:1||manganese oxide:1||TRANSITION:1||magnetic structures:1||oxides:1||IRON:1||AL FILMS:1||ZnO:1||RAY PHOTOELECTRONSPECTROSCOPY:1||TRANSPARENT:1||

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