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In-situ Synchrotron X-ray Diffraction measurement of Epitaxial FeRh Thin Films
- Title
- In-situ Synchrotron X-ray Diffraction measurement of Epitaxial FeRh Thin Films
- Date Issued
- 2010-01-05
- Publisher
- IEEE Electronic Devices Sodiety
- Article Type
- Conference
- Citation
- IEEE International NanoElectronics Conference 2010, 2010-01-05
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Related Researcher
- 권순주KWON, SOON JU
- Dept of Materials Science & Enginrg