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SYNCHROTRON GRAZING INCIDENCE X-RAY SCATTERING TECHNIQUE IN CHARACTERIZING STRUCTURES OF NANOPOROUS THIN FILMS AND ITS COMPARISONS WITH OTHER ANALYTICAL METHODS
- Title
- SYNCHROTRON GRAZING INCIDENCE X-RAY SCATTERING TECHNIQUE IN CHARACTERIZING STRUCTURES OF NANOPOROUS THIN FILMS AND ITS COMPARISONS WITH OTHER ANALYTICAL METHODS
- Authors
- 이문호
- Date Issued
- 2005-01
- Publisher
- .
- Article Type
- Article
- Citation
- SYNCHROTRON RADIATION SCIENCE & TECHNOLOGY, vol. 12, page. 39409, 2005-01
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Related Researcher
- 이문호REE, MOONHOR
- Dept of Chemistry