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dc.contributor.author이문호-
dc.date.accessioned2018-01-09T02:55:01Z-
dc.date.available2018-01-09T02:55:01Z-
dc.date.created2009-03-26-
dc.date.issued2005-01-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/40329-
dc.languageEnglish-
dc.publisher.-
dc.relation.isPartOfSYNCHROTRON RADIATION SCIENCE & TECHNOLOGY-
dc.titleSYNCHROTRON GRAZING INCIDENCE X-RAY SCATTERING TECHNIQUE IN CHARACTERIZING STRUCTURES OF NANOPOROUS THIN FILMS AND ITS COMPARISONS WITH OTHER ANALYTICAL METHODS-
dc.typeArticle-
dc.type.rimsART-
dc.identifier.bibliographicCitationSYNCHROTRON RADIATION SCIENCE & TECHNOLOGY, v.12, pp.39409-
dc.citation.startPage39409-
dc.citation.titleSYNCHROTRON RADIATION SCIENCE & TECHNOLOGY-
dc.citation.volume12-
dc.contributor.affiliatedAuthor이문호-
dc.description.journalClass1-
dc.description.journalClass1-
dc.type.docTypeARTICLE-

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이문호REE, MOONHOR
Dept of Chemistry
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