A new S-2 control chart using repetitive sampling

Abstract

A new S-2 control chart is presented for monitoring the process variance by utilizing a repetitive sampling scheme. The double control limits called inner and outer control limits are proposed, whose coefficients are determined by considering the average run length (ARL) and the average sample number when the process is in control. The proposed control chart is compared with the existing Shewhart S-2 control chart in terms of the ARLs. The result shows that the proposed control chart is more efficient than the existing control chart in detecting the process shift.