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Cited 28 time in webofscience Cited 30 time in scopus
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dc.contributor.authorAslam, M-
dc.contributor.authorKhan, N-
dc.contributor.authorJun, CH-
dc.date.accessioned2017-07-19T12:43:44Z-
dc.date.available2017-07-19T12:43:44Z-
dc.date.created2016-01-06-
dc.date.issued2015-11-02-
dc.identifier.issn0266-4763-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/36327-
dc.description.abstractA new S-2 control chart is presented for monitoring the process variance by utilizing a repetitive sampling scheme. The double control limits called inner and outer control limits are proposed, whose coefficients are determined by considering the average run length (ARL) and the average sample number when the process is in control. The proposed control chart is compared with the existing Shewhart S-2 control chart in terms of the ARLs. The result shows that the proposed control chart is more efficient than the existing control chart in detecting the process shift.-
dc.languageEnglish-
dc.publisherTAYLOR & FRANCIS LTD-
dc.relation.isPartOfJOURNAL OF APPLIED STATISTICS-
dc.titleA new S-2 control chart using repetitive sampling-
dc.typeArticle-
dc.identifier.doi10.1080/02664763.2015.1043861-
dc.type.rimsART-
dc.identifier.bibliographicCitationJOURNAL OF APPLIED STATISTICS, v.42, no.11, pp.2485 - 2496-
dc.identifier.wosid000361468900014-
dc.date.tcdate2019-02-01-
dc.citation.endPage2496-
dc.citation.number11-
dc.citation.startPage2485-
dc.citation.titleJOURNAL OF APPLIED STATISTICS-
dc.citation.volume42-
dc.contributor.affiliatedAuthorJun, CH-
dc.identifier.scopusid2-s2.0-84941997320-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc12-
dc.description.scptc11*
dc.date.scptcdate2018-05-121*
dc.type.docTypeArticle-
dc.subject.keywordPlusS CONTROL CHARTS-
dc.subject.keywordPlusSTANDARD-DEVIATION-
dc.subject.keywordPlusDESIGN-
dc.subject.keywordPlusDISPERSION-
dc.subject.keywordAuthorrepetitive sampling-
dc.subject.keywordAuthorcontrol chart-
dc.subject.keywordAuthoraverage run length-
dc.subject.keywordAuthorprocess shift-
dc.relation.journalWebOfScienceCategoryStatistics & Probability-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaMathematics-

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