Direct evidence of the step-edge buckling at the Au/Si(557)-1x2 surface
SCIE
SCOPUS
- Title
- Direct evidence of the step-edge buckling at the Au/Si(557)-1x2 surface
- Authors
- Han, JH; Kim, HS; Hwang, HN; Kim, B; Chung, S; Chung, JW; Hwang, CC
- Date Issued
- 2009-12
- Publisher
- AMER PHYSICAL SOC
- Abstract
- We have investigated atomic structure and electrical properties of the Au/Si(557)-1x2 surface by using scanning tunneling microscopy. We observe the doubled periodicity (x2) for the step-edge atoms even far away from defects at room temperature (RT), indicating no Peierls-type transition reported earlier. We further identify the Au atoms well resolved from Si atoms in the Au-Si-Au chain at RT, in good accord with the prevailing structural model. Our scanning tunneling spectroscopy data taken along the step-edge atoms unambiguously reveal that these step-edge Si atoms are metallic, and are buckled apparently with a charge transferred from down to up Si atoms. We find no significant thermal fluctuation of the buckled step edges at RT.
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/26380
- DOI
- 10.1103/PHYSREVB.80.241401
- ISSN
- 1098-0121
- Article Type
- Article
- Citation
- PHYSICAL REVIEW B, vol. 80, no. 24, page. 241401 - 241401, 2009-12
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