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Self-Formed Exchange Bias of Switchable Conducting Filaments in NiO Resistive Random Access Memory Capacitors
- Title
- Self-Formed Exchange Bias of Switchable Conducting Filaments in NiO Resistive Random Access Memory Capacitors
- POSTECH Authors
- Jang, HM
- Date Issued
- Apr-2010
- Publisher
- AMER CHEMICAL SOC
- Keywords
- NiO; conducting filaments; exchange coupling; resistive switching; NANOSTRUCTURES; DEPENDENCE; RESISTANCE; FILMS; FIELD
- ISSN
- 1936-0851
- Article Type
- Article
- Citation
- ACS NANO, vol. 4, no. 6, page. 3288 - 3292, 2010-04
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- 장현명JANG, HYUN MYUNG
- Convergence Science and Technology