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Cited 51 time in webofscience Cited 53 time in scopus
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Self-Formed Exchange Bias of Switchable Conducting Filaments in NiO Resistive Random Access Memory Capacitors

Title
Self-Formed Exchange Bias of Switchable Conducting Filaments in NiO Resistive Random Access Memory Capacitors
Authors
Son, JYKim, CHCho, JHShin, YHJang, HM
POSTECH Authors
Jang, HM
Date Issued
Apr-2010
Publisher
AMER CHEMICAL SOC
Keywords
NiO; conducting filaments; exchange coupling; resistive switching; NANOSTRUCTURES; DEPENDENCE; RESISTANCE; FILMS; FIELD
URI
http://oasis.postech.ac.kr/handle/2014.oak/25831
DOI
10.1021/NN100323X
ISSN
1936-0851
Article Type
Article
Citation
ACS NANO, vol. 4, no. 6, page. 3288 - 3292, 2010-04
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장현명JANG, HYUN MYUNG
Convergence Science and Technology
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