Tetra-sigma bonding adsorption of pyridine on Si(100)-2x1
SCIE
SCOPUS
- Title
- Tetra-sigma bonding adsorption of pyridine on Si(100)-2x1
- Authors
- Lee, HK; Kim, KJ; Kang, TH; Kim, S; Chung, JW; Kim, B
- Date Issued
- 2008-07
- Publisher
- ELSEVIER SCIENCE BV
- Abstract
- We studied adsorption of pyridine on Si(100) at room temperature using high resolution photoemission spectroscopy (PES) and near edge X-ray adsorption fine structure (NEXAFS) in the partial electron yield (PEY) mode. The Si 2p, C 1s, N 1s spectra of pyridine on Si(100) showed that pyridine is chemisorbed on Si(100)-2 x 1 through the formation of the tetra-sigma-bonded structure with the N atom and three C atoms. NEXAFS was conducted to characterize the adsorption geometry of pyridine on Si(100). The pi* orbital of C=C bond showed a good angle dependence in C K-edge NEXAFS spectra, and we were able to estimate the adsorption angle between chemisorbed pyridine of C=C bond and the Si(100) Surface using an analytical solution of NEXAFS intensity. We find the coexistence of two different tight bridges with the adsorption angles 42 +/- 21 degrees and 45 +/- 21 degrees with almost equal abundance. (C) 2008 Elsevier B.V. All rights reserved.
- Keywords
- pyridine; Si(100); adsorption; modification; functionalization; PES; NEXAFS; molecular orientation; organic-semiconductor interface; SPECTROSCOPY; SURFACES; PYRROLE; X-1; PHOTOEMISSION; TEMPERATURE; ELECTRONICS; BEAMLINE; FILMS
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/22603
- DOI
- 10.1016/j.elspec.2008.05.005
- ISSN
- 0368-2048
- Article Type
- Article
- Citation
- JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, vol. 164, no. 1-3, page. 44 - 47, 2008-07
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