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Cited 11 time in webofscience Cited 12 time in scopus
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dc.contributor.authorLee, HK-
dc.contributor.authorKim, KJ-
dc.contributor.authorKang, TH-
dc.contributor.authorKim, S-
dc.contributor.authorChung, JW-
dc.contributor.authorKim, B-
dc.date.accessioned2016-04-01T01:14:43Z-
dc.date.available2016-04-01T01:14:43Z-
dc.date.created2009-03-13-
dc.date.issued2008-07-
dc.identifier.issn0368-2048-
dc.identifier.other2008-OAK-0000007995-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/22603-
dc.description.abstractWe studied adsorption of pyridine on Si(100) at room temperature using high resolution photoemission spectroscopy (PES) and near edge X-ray adsorption fine structure (NEXAFS) in the partial electron yield (PEY) mode. The Si 2p, C 1s, N 1s spectra of pyridine on Si(100) showed that pyridine is chemisorbed on Si(100)-2 x 1 through the formation of the tetra-sigma-bonded structure with the N atom and three C atoms. NEXAFS was conducted to characterize the adsorption geometry of pyridine on Si(100). The pi* orbital of C=C bond showed a good angle dependence in C K-edge NEXAFS spectra, and we were able to estimate the adsorption angle between chemisorbed pyridine of C=C bond and the Si(100) Surface using an analytical solution of NEXAFS intensity. We find the coexistence of two different tight bridges with the adsorption angles 42 +/- 21 degrees and 45 +/- 21 degrees with almost equal abundance. (C) 2008 Elsevier B.V. All rights reserved.-
dc.description.statementofresponsibilityX-
dc.languageEnglish-
dc.publisherELSEVIER SCIENCE BV-
dc.relation.isPartOfJOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA-
dc.subjectpyridine-
dc.subjectSi(100)-
dc.subjectadsorption-
dc.subjectmodification-
dc.subjectfunctionalization-
dc.subjectPES-
dc.subjectNEXAFS-
dc.subjectmolecular orientation-
dc.subjectorganic-semiconductor interface-
dc.subjectSPECTROSCOPY-
dc.subjectSURFACES-
dc.subjectPYRROLE-
dc.subjectX-1-
dc.subjectPHOTOEMISSION-
dc.subjectTEMPERATURE-
dc.subjectELECTRONICS-
dc.subjectBEAMLINE-
dc.subjectFILMS-
dc.titleTetra-sigma bonding adsorption of pyridine on Si(100)-2x1-
dc.typeArticle-
dc.contributor.college물리학과-
dc.identifier.doi10.1016/j.elspec.2008.05.005-
dc.author.googleLee, HK-
dc.author.googleKim, KJ-
dc.author.googleKang, TH-
dc.author.googleKim, S-
dc.author.googleChung, JW-
dc.author.googleKim, B-
dc.relation.volume164-
dc.relation.issue1-3-
dc.relation.startpage44-
dc.relation.lastpage47-
dc.contributor.id10052578-
dc.relation.journalJOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA-
dc.relation.indexSCI급, SCOPUS 등재논문-
dc.relation.sciSCI-
dc.collections.nameJournal Papers-
dc.type.rimsART-
dc.identifier.bibliographicCitationJOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, v.164, no.1-3, pp.44 - 47-
dc.identifier.wosid000258050700007-
dc.date.tcdate2019-01-01-
dc.citation.endPage47-
dc.citation.number1-3-
dc.citation.startPage44-
dc.citation.titleJOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA-
dc.citation.volume164-
dc.contributor.affiliatedAuthorChung, JW-
dc.identifier.scopusid2-s2.0-45949110205-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc9-
dc.type.docTypeArticle-
dc.subject.keywordPlusSPECTROSCOPY-
dc.subject.keywordPlusSURFACES-
dc.subject.keywordPlusPYRROLE-
dc.subject.keywordPlusX-1-
dc.subject.keywordPlusPHOTOEMISSION-
dc.subject.keywordPlusTEMPERATURE-
dc.subject.keywordPlusELECTRONICS-
dc.subject.keywordPlusBEAMLINE-
dc.subject.keywordPlusFILMS-
dc.subject.keywordAuthorpyridine-
dc.subject.keywordAuthorSi(100)-
dc.subject.keywordAuthoradsorption-
dc.subject.keywordAuthormodification-
dc.subject.keywordAuthorfunctionalization-
dc.subject.keywordAuthorPES-
dc.subject.keywordAuthorNEXAFS-
dc.subject.keywordAuthormolecular orientation-
dc.subject.keywordAuthororganic-semiconductor interface-
dc.relation.journalWebOfScienceCategorySpectroscopy-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaSpectroscopy-

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