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Scanning Photoemission Microscopy of Graphene Sheets on SiO2 SCIE SCOPUS
- Title
- Scanning Photoemission Microscopy of Graphene Sheets on SiO2
- Authors
- Kim, KJ; Lee, H; Choi, JH; Youn, YS; Choi, J; Lee, H; Kang, TH; Jung, MC; Shin, HJ; Lee, HJ; Kim, S; Kim, B
- Date Issued
- 2008-10-02
- Publisher
- WILEY-V C H VERLAG GMBH
- Abstract
- Scanning photoemission microscopy (SPEM) images of a graphene flake as well as the C Is core level spectra for the mono- and multilayer graphene are measured. The samples with lateral dimensions on the micrometer scale are prepared on a SiO2 surface by direct exfoliation of crystalline graphite. Monolayer graphene is distinguished from the multilayer graphenes through the chemical contrast images of SPEM.
- Keywords
- GRAPHITE; LAYER
- ISSN
- 0935-9648
- Article Type
- Article
- Citation
- ADVANCED MATERIALS, vol. 20, no. 19, page. 3589 - 3589, 2008-10-02
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Communities & Collection
Related Researcher
- 이후종LEE, HU JONG
- Dept of Physics