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  Department of Physics (물리학과) 1. Journal Papers

 

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Cited 39 time in webofscience Cited 41 time in scopus
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dc.contributor.authorKim, KJ-
dc.contributor.authorLee, H-
dc.contributor.authorChoi, JH-
dc.contributor.authorYoun, YS-
dc.contributor.authorChoi, J-
dc.contributor.authorLee, H-
dc.contributor.authorKang, TH-
dc.contributor.authorJung, MC-
dc.contributor.authorShin, HJ-
dc.contributor.authorLee, HJ-
dc.contributor.authorKim, S-
dc.contributor.authorKim, B-
dc.date.accessioned2016-04-01T01:07:56Z-
dc.date.available2016-04-01T01:07:56Z-
dc.date.created2009-08-21-
dc.date.issued2008-10-02-
dc.identifier.issn0935-9648-
dc.identifier.other2008-OAK-0000008228-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/22450-
dc.description.abstractScanning photoemission microscopy (SPEM) images of a graphene flake as well as the C Is core level spectra for the mono- and multilayer graphene are measured. The samples with lateral dimensions on the micrometer scale are prepared on a SiO2 surface by direct exfoliation of crystalline graphite. Monolayer graphene is distinguished from the multilayer graphenes through the chemical contrast images of SPEM.-
dc.description.statementofresponsibilityX-
dc.languageEnglish-
dc.publisherWILEY-V C H VERLAG GMBH-
dc.relation.isPartOfADVANCED MATERIALS-
dc.subjectGRAPHITE-
dc.subjectLAYER-
dc.titleScanning Photoemission Microscopy of Graphene Sheets on SiO2-
dc.typeArticle-
dc.contributor.college물리학과-
dc.identifier.doi10.1002/ADMA.2008007-
dc.author.googleKim, KJ-
dc.author.googleLee, H-
dc.author.googleChoi, JH-
dc.author.googleYoun, YS-
dc.author.googleChoi, J-
dc.author.googleKang, TH-
dc.author.googleJung, MC-
dc.author.googleShin, HJ-
dc.author.googleLee, HJ-
dc.author.googleKim, S-
dc.author.googleKim, B-
dc.relation.volume20-
dc.relation.issue19-
dc.relation.startpage3589-
dc.relation.lastpage3589-
dc.contributor.id10080084-
dc.relation.journalADVANCED MATERIALS-
dc.relation.indexSCI급, SCOPUS 등재논문-
dc.relation.sciSCI-
dc.collections.nameJournal Papers-
dc.type.rimsART-
dc.identifier.bibliographicCitationADVANCED MATERIALS, v.20, no.19, pp.3589 - 3589-
dc.identifier.wosid000260023900001-
dc.date.tcdate2019-01-01-
dc.citation.endPage3589-
dc.citation.number19-
dc.citation.startPage3589-
dc.citation.titleADVANCED MATERIALS-
dc.citation.volume20-
dc.contributor.affiliatedAuthorLee, HJ-
dc.identifier.scopusid2-s2.0-54949141781-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc36-
dc.type.docTypeArticle-
dc.relation.journalWebOfScienceCategoryChemistry, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryChemistry, Physical-
dc.relation.journalWebOfScienceCategoryNanoscience & Nanotechnology-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.relation.journalWebOfScienceCategoryPhysics, Condensed Matter-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaChemistry-
dc.relation.journalResearchAreaScience & Technology - Other Topics-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-
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이후종LEE, HU JONG
Dept of Physics
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