Crystallographic texture evolution of hexagonal CoCrMn thin films depending on the Mn content and processing parameters
SCIE
SCOPUS
- Title
- Crystallographic texture evolution of hexagonal CoCrMn thin films depending on the Mn content and processing parameters
- Authors
- Song, HJ; Shin, KH; Kwon, SJ
- Date Issued
- 2001-05
- Publisher
- ELSEVIER SCIENCE BV
- Abstract
- Texture of CoCrMn alloy thin films with varing Mn content was investigated by X-ray diffraction. HCP (Co64Cr36)(100-x)Mn-x (5
- Keywords
- texture; thin films-sputtered; X-ray diffraction; transition metal-ternary compounds
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/20982
- DOI
- 10.1016/S0304-8853(00)01376-7
- ISSN
- 0304-8853
- Article Type
- Article
- Citation
- JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, vol. 226, page. 1666 - 1668, 2001-05
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- There are no files associated with this item.
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