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Article
Cited 15 time in webofscience Cited 16 time in scopus
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Highly reliable resistive switching without an initial forming operation by defect engineering

Title
Highly reliable resistive switching without an initial forming operation by defect engineering
Authors
Lee, SLee, DWoo, JCha, EPark, JSong, JMoon, KKoo, YAttari, BTamanna, NHaque, MSHwang, H
POSTECH Authors
Hwang, H
Date Issued
2013-12
Publisher
Institute of Electrical and Electronics Engineers Inc.
Keywords
Defect engineering; reliability; resistive switching; retention; MEMORY
URI
https://oasis.postech.ac.kr/handle/2014.oak/14929
DOI
10.1109/LED.2013.2284916
ISSN
0741-3106
Article Type
Article
Citation
IEEE Electron Device Letters, vol. 34, no. 12, page. 1515 - 1517, 2013-12
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황현상HWANG, HYUNSANG
Dept of Materials Science & Enginrg
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