Open Access System for Information Sharing

Login Library

 

Article
Cited 15 time in webofscience Cited 16 time in scopus
Metadata Downloads
Full metadata record
Files in This Item:
There are no files associated with this item.
DC FieldValueLanguage
dc.contributor.authorLee, Sko
dc.contributor.authorLee, Dko
dc.contributor.authorWoo, Jko
dc.contributor.authorCha, Eko
dc.contributor.authorPark, Jko
dc.contributor.authorSong, Jko
dc.contributor.authorMoon, Kko
dc.contributor.authorKoo, Yko
dc.contributor.authorAttari, Bko
dc.contributor.authorTamanna, Nko
dc.contributor.authorHaque, MSko
dc.contributor.authorHwang, Hko
dc.date.available2016-03-31T08:16:07Z-
dc.date.created2014-03-03-
dc.date.issued2013-12-
dc.identifier.citationIEEE Electron Device Letters, v.34, no.12, pp.1515 - 1517-
dc.identifier.issn0741-3106-
dc.identifier.other2013-OAK-0000029031-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/14929-
dc.description.statementofresponsibilityX-
dc.languageEnglish-
dc.publisherInstitute of Electrical and Electronics Engineers Inc.-
dc.subjectDefect engineering-
dc.subjectreliability-
dc.subjectresistive switching-
dc.subjectretention-
dc.subjectMEMORY-
dc.titleHighly reliable resistive switching without an initial forming operation by defect engineering-
dc.typeArticle-
dc.contributor.college신소재공학과-
dc.identifier.doi10.1109/LED.2013.2284916-
dc.author.googleLee, S-
dc.author.googleLee, D-
dc.author.googleWoo, J-
dc.author.googleCha, E-
dc.author.googlePark, J-
dc.author.googleSong, J-
dc.author.googleMoon, K-
dc.author.googleKoo, Y-
dc.author.googleAttari, B-
dc.author.googleTamanna, N-
dc.author.googleHaque, MS-
dc.author.googleHwang, H-
dc.relation.volume34-
dc.relation.issue12-
dc.relation.startpage1515-
dc.relation.lastpage1517-
dc.contributor.id10079928-
dc.publisher.locationUS-
dc.relation.journalIEEE Electron Device Letters-
dc.relation.indexSCI급, SCOPUS 등재논문-
dc.relation.sciSCI-
dc.collections.nameJournal Papers-
dc.type.rimsART-
dc.contributor.localauthorHwang, H-
dc.contributor.nonIdAuthorLee, S-
dc.contributor.nonIdAuthorLee, D-
dc.contributor.nonIdAuthorWoo, J-
dc.contributor.nonIdAuthorCha, E-
dc.contributor.nonIdAuthorPark, J-
dc.contributor.nonIdAuthorSong, J-
dc.contributor.nonIdAuthorMoon, K-
dc.contributor.nonIdAuthorKoo, Y-
dc.contributor.nonIdAuthorAttari, B-
dc.contributor.nonIdAuthorTamanna, N-
dc.contributor.nonIdAuthorHaque, MS-
dc.identifier.wosid000327640400017-
dc.date.tcdate2019-01-01-
dc.citation.endPage1517-
dc.citation.number12-
dc.citation.startPage1515-
dc.citation.titleIEEE Electron Device Letters-
dc.citation.volume34-
dc.identifier.scopusid2-s2.0-84889574407-
dc.description.journalClass1-
dc.description.wostc12-
dc.description.scptc13*
dc.date.scptcdate2018-05-121*

qr_code

  • mendeley

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher

황현상HWANG, HYUNSANG
Dept of Materials Science & Enginrg
Read more

Views & Downloads

Browse