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Defect Generation in Data-Storage Layer by Strong Ion Bombardment for Multi-level Non-volatile Memory Applications SCIE SCOPUS

Title
Defect Generation in Data-Storage Layer by Strong Ion Bombardment for Multi-level Non-volatile Memory Applications
Authors
PARK, SEONGMINCHANG, MIN JEONSEO, TAEWONLEE, YONGGYUCHUNG, YOONYOUNG
Date Issued
2022-05
Publisher
Elsevier Ltd.
URI
https://oasis.postech.ac.kr/handle/2014.oak/115320
DOI
10.1016/j.mtnano.2022.100226
ISSN
2588-8420
Article Type
Article
Citation
Materials Today Nano, vol. 19, 2022-05
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정윤영CHUNG, YOONYOUNG
Dept of Electrical Enginrg
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